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All articles from Luis Maldonado

Electronics Reliability
• Aug 12, 2025 12:41:33 PM

Flip-Chip Package Theta-JA Thermal Resistance Characterization Using Ansys Fluent
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Electronics Reliability
• Jul 28, 2025 10:37:51 AM

Flip-Chip Package Theta-JB and Theta-JC Thermal Resistance Characterization using Ansys Fluent
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Luis Maldonado
Luis Maldonado

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